Automating Semiconductor Test Productivity

Hosted by: Collaborative Alliance for Semiconductor Test (CAST)

Tuesday, July 14
10:30am - 12:30pm


With the transition to 300mm wafers, Fabs took productivity to new levels through the introduction of new material handling systems, recipe automation, stockers, etc.  The proposal is that there must be similar opportunities in Test (and Packaging) operations to increase the levels of automation in both hardware and software.  Possible topics could include material (ID) tracking, material handling, equipment monitoring and management, automated setups, etc. 

As more IoT products come to market, they will put even more cost pressure on manufacturing and, at Test, capital costs have already been squeezed, leaving productivity as the next frontier.  This panel of distinguished test professionals from the chipmaking community will discuss these opportunities for automating test operations to maximize productivity and raise overall efficiency.  




Welcome and Opening Address

Ron Leckie



CAST Overview and Working Group Updates

Standard Test Data Format (STDF) Working Group

Stacy Ajouri (Biography)

Senior Member, Technical Staff
Texas Instruments




Tester Event Messaging for Semiconductors (TEMS) Working Group

 Software Product Manager (Biography)
Keith Thomas,Terdayne 



Tester Event Messaging for Semiconductors (TEMS) Working Group

Steve McDowall (Biography)
VP Engineering and Chief Software Architect

Galaxy Semiconductor 
11:30am-12:30pm Panel Session




Ron Leckie




David Park (Biography)
Vice President
World Wide Marketing



Kenneth Harris, Ph.D. (Biography)

Director of Product Management
PDF Solutions


Dale Ohmart (Biography)

Distinguished Member of the Technical Staff

 Texas Instruments


Michael Goldbach, Ph.D.
Vice President, Handler Group and Test Cell Innovation


Greg Lewis (Biography)

Director of Sales & Operations, ISE Labs

ASE Group

Bookmark and Share Google+